The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7480824 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 20, 2009

Filed:

Feb. 23, 2005
Applicants:

Tatsushi Hakuchoh, Ksusatsu, JP;

Tomoaki Kimura, Fujisawa, JP;

Tsuyoshi Miyamura, Yokohama, JP;

Inventors:

Tatsushi Hakuchoh, Ksusatsu, JP;

Tomoaki Kimura, Fujisawa, JP;

Tsuyoshi Miyamura, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

When a testing system is connected to a debug port of a tape drive unit or a SCSI bus, a self-checking test for a fabricating process is executed. When the testing system is not connected, the self-checking test for normal operation is executed. And in a test of a single card, a motor test and an MR head resistance test, which are tests of a mechanical structure portion, are omitted. In addition, in a box assembling process, the test contents are suppressed to a minimum prior to adjustments to the, tape head. Furthermore, in a test program, the status of a flag or an indication corresponding to a test executed in a next step is changed.


Find Patent Forward Citations

Hakuchoh, Tatsushi. (2009). Method for controlling starting operation of unit and executing self-checking test (U.S. Patent No. 7480824). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7480824

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