The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Oct. 31, 2005
Applicants:

Takeshi Shigemura, Odawara, JP;

Seiki Morita, Odawara, JP;

Atsushi Ishikawa, Minami ashigara, JP;

Yoshihiro Uchiyama, Odawara, JP;

Inventors:

Takeshi Shigemura, Odawara, JP;

Seiki Morita, Odawara, JP;

Atsushi Ishikawa, Minami ashigara, JP;

Yoshihiro Uchiyama, Odawara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention proposes a disk array apparatus that can be inexpensively constructed while maintaining its high reliability, and also proposes a method for controlling the disk array apparatus, and a program. In the disk array apparatus, a storage area in a storage device for storing system information is managed by dividing the storage area into a system area for storing system information and a data area for storing data from a host device, and verification processing is executed on the data area in the storage device in a first cycle and on the system area in a second cycle that is shorter than the first cycle.


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