The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Jun. 30, 2005
Applicant:
Masahiro Toyosada, Fukuoka, JP;
Inventor:
Masahiro Toyosada, Fukuoka, JP;
Assignee:
Kyushu Tlo Company, Limited, Fukuoka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
There are provided a fatigue crack growth curve estimation method, an estimation program, and an estimation device capable of strictly estimating the detail of the metal fatigue end and the crack growth detail. The fatigue crack growth curve estimation device () uses a first calculation means (), second calculation means (), third calculation means (), fourth calculation means (), and fifth calculation means () to strictly estimate the detail of growth of a crack generated and growing in a first grain while omitting a calculation on the load pair not contributing to growth of the crack.