The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Apr. 18, 2005
Brian W. Lasiuk, Spring, TX (US);
Thomas J. Batzinger, Burnt Hills, NY (US);
Manoharan Venugopal, Bangalore, IN;
Elizabeth L. Dixon, Delanson, NY (US);
Michael R. Hopple, Scotia, NY (US);
Nityanand Gopalika, Bihar, IN;
Sivaramanivas Ramaswamy, Bangalore Karnataka, IN;
Debasish Mishra, Bangalore, IN;
Rajashekar Venkatachalam, Bangalore, IN;
Vamishi Krishna Reddy Kommareddy, Bangalore, IN;
Brian W. Lasiuk, Spring, TX (US);
Thomas J. Batzinger, Burnt Hills, NY (US);
Manoharan Venugopal, Bangalore, IN;
Elizabeth L. Dixon, Delanson, NY (US);
Michael R. Hopple, Scotia, NY (US);
Nityanand Gopalika, Bihar, IN;
Sivaramanivas Ramaswamy, Bangalore Karnataka, IN;
Debasish Mishra, Bangalore, IN;
Rajashekar Venkatachalam, Bangalore, IN;
Vamishi Krishna Reddy Kommareddy, Bangalore, IN;
GE Betz, Inc., Trevose, PA (US);
Abstract
A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object. The calibration procedures are adapted for extracting a thickness map from both isotope sources and X-ray tube sources.