The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Apr. 14, 2003
Applicants:

James Ray Bailey, Shelbyville, KY (US);

Joseph Yackzan, Lexington, KY (US);

Inventors:

James Ray Bailey, Shelbyville, KY (US);

Joseph Yackzan, Lexington, KY (US);

Assignee:

Lexmark International, Inc, Lexington, KY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06K 1/00 (2006.01); G03F 3/08 (2006.01); H04N 1/409 (2006.01);
U.S. Cl.
CPC ...
Abstract

Lines of input image data are scaled in a first dimension, the one-dimensionally scaled lines are stored in a buffer memory until a sufficient number of lines have been stored to perform scaling equally in two dimensions, and the stored lines are then scaled in a second dimension to produce image data scaled two-dimensionally by a user-selected scaling percentage. A first image scaling method is used to scale the input image data if the user-selected scaling percentage exceeds a predetermined threshold value, such as 50 percent, and a second scaling method is used if the scaling percentage does not exceed the threshold value. The first method can be, for example, linear interpolation, and the second method can be, for example, averaging.


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