The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Jun. 04, 2004
Ole Henrik Waagaard, Trondheim, NO;
Erlend Ronnekleiv, Trondheim, NO;
Ole Henrik Waagaard, Trondheim, NO;
Erlend Ronnekleiv, Trondheim, NO;
Optoplan AS, Trondheim, NO;
Abstract
A method for interrogating time-multiplexed interferometric sensors using multiple interrogation pulses so as to increases the allowable interrogation pulse duty-cycle and improve the signal-to-noise ratio. In each TDM repetition period a sequence of multiple interrogation pulses are generated. The pulses in the sequence are separated by a time that is equal to the sensor imbalance. The phase from pulse to pulse in each TDM time-slot is modulated at a different, linear rate such that the pulse in time-slot m will have an optical frequency that is shifted by mΔν, where Δν is the sub-carrier frequency. Because multiple reflections do not need to fade out the inventive method can enhance the signal-to-noise ratio of interferometric sensors such as inline Fabry-Perot sensors.