The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Jun. 30, 2005
Applicants:

J. Michael Phillips, San Carlos, CA (US);

Aldrich N. K. Lau, Palo Alto, CA (US);

Mark F. Oldham, Los Gatos, CA (US);

Kevin S. Bodner, Belmont, CA (US);

Steven J. Boege, San Mateo, CA (US);

Donald R. Sandell, San Jose, CA (US);

David H. Tracy, Norwalk, CT (US);

Inventors:

J. Michael Phillips, San Carlos, CA (US);

Aldrich N. K. Lau, Palo Alto, CA (US);

Mark F. Oldham, Los Gatos, CA (US);

Kevin S. Bodner, Belmont, CA (US);

Steven J. Boege, San Mateo, CA (US);

Donald R. Sandell, San Jose, CA (US);

David H. Tracy, Norwalk, CT (US);

Assignee:

Applied Biosystems Inc., Foster City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.


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