The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Nov. 22, 2005
John W. Juvinall, Ottawa Lake, MI (US);
Brian A. Langenderfer, Sylvania, OH (US);
John W. Juvinall, Ottawa Lake, MI (US);
Brian A. Langenderfer, Sylvania, OH (US);
Owens-Brockway Glass Container Inc., Perrysburg, OH (US);
Abstract
Apparatus for inspecting contour of a container sidewall includes at least one light source for directing light energy onto the container sidewall and at least one light sensor disposed to receive light energy from the light source reflected from the container sidewall. The light sensor is responsive to such reflected light energy to provide signals indicative of position of the container sidewall relative to the sensor at at least two locations on the container sidewall spaced from each other in the direction of the container axis. An information processor is responsive to such signals to determine contour of the container sidewall as a function of sidewall positions at such locations. The at least two locations on the container sidewall preferably are nominally aligned with each other in a direction parallel to the container axis. One of the locations on the container sidewall preferably is adjacent to the container shoulder or the container heel, and another of the locations is on the container sidewall between the container shoulder and the container heel.