The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Aug. 27, 2007
Applicants:

Avi P. Cohn, Hood River, OR (US);

Larry H. Mack, Jr., Sugar Land, TX (US);

Inventors:

Avi P. Cohn, Hood River, OR (US);

Larry H. Mack, Jr., Sugar Land, TX (US);

Assignee:

Satake USA, Inc., Stafford, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); B07C 5/342 (2006.01); F21S 1/00 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An illumination device for use with a product inspection machine inspecting products according to at least one characteristic using pulsed illumination for inspection in two wavelengths. The invention includes a plurality of arrays of semiconductor light sources from which a wavelength may be selected, either specifically or by combination of specific semiconductor light sources, for impinging on passing product and at least one array of semiconductor light sources from which the same wavelength may be selected and which provides intensity equal to the plurality of arrays impinging on a background surface for detection and comparison.


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