The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Dec. 29, 2005
James L. Overbeck, Ada, MI (US);
Richard J. Van Andel, Grand Rapids, MI (US);
James L. Overbeck, Ada, MI (US);
Richard J. Van Andel, Grand Rapids, MI (US);
X-Rite, Inc., Grand Rapids, MI (US);
Abstract
Imaging that uses glare to confirm proper measurement of a sample. An imaging device illuminates an object and generates glare (i.e., specular reflection, diffuse reflection or a combination of the two) off the object's surface, which is displayed on a display as a glare artifact. The location of the glare artifact is compared to a predetermined location to establish adjustment to obtain a desired angular orientation. The imaging device optionally highlights the glare artifact and steers a user to obtain the desired presentation angle. In two other embodiments, the spatial relationship between the imaging device and the object is time-varied. In one, the imaging device monitors changing glare and acquires a measurement when a desired glare is detected. In the other, the imaging device captures multiple images including varying glare artifacts and analyzes the images to select a preferred image having a glare artifact indicative of a desired angular orientation.