The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Jul. 03, 2003
Hitoshi Otani, Tokyo, JP;
Nobuo Kochi, Tokyo, JP;
Takayuki Noma, Tokyo, JP;
Topcon Corporation, Tokyo, JP;
Abstract
A device for measuring data for calibration for obtaining data for calibration of a cameracapable of varying its optical conditions, wherein the data for calibration are obtained using a plurality of images of a calibration charthaving marks arranged thereon which were photographed with the cameraunder varied optical conditions, comprising: a mark extracting partfor extracting the marks from the images of the chart; an internal parameter calculating partfor calculating data for calibration under optical conditions under which the images of the chart were photographed based on the positions of the marks extracted by the mark extracting part and a plurality of conditions under which the images of the chart were photographed; and an internal parameter function calculating partfor calculating data for calibration corresponding to the varied optical photographing conditions of the camera, using the data for calibration calculated in the internal parameter calculating part and a plurality of optical conditions under which the images of the chart were photographed. The device can remove the effect of lens distortion from an image photographed with a camera capable of varying its optical conditions.