The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Oct. 09, 2001
Applicants:

Ikuo Matsumura, Tokyo, JP;

Hiroshi Kaneda, Tokyo, JP;

Yoshimitsu Tanaka, Kanagawa, JP;

Inventors:

Ikuo Matsumura, Tokyo, JP;

Hiroshi Kaneda, Tokyo, JP;

Yoshimitsu Tanaka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for adjustment and abnormality display includes a pseudo screen displaying unit for displaying each of a plurality of display units forming a display apparatus as a pseudo display unit according to position information of the display units; a selecting unit for selecting a specified pseudo display unit from the pseudo display units displayed; an adjusting information generating unit for generating information for adjusting the display unit corresponding to the pseudo display unit selected based on an adjusting operation; and an abnormality signal generating unit for generating an abnormality signal when an abnormality occurs in a display unit forming the display apparatus, wherein the selected display unit is adjusted by outputting the adjusting information to the display apparatus, and the pseudo display unit corresponding to the display unit having the abnormality is distinguishably displayed in the pseudo screen displaying unit based on the abnormality signal.


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