The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Dec. 07, 2006
Applicants:
Byung-wook Park, Suwon-si, KR;
Byeong-hwan Cho, Yongin-si, KR;
Young-dong Nam, Seongnam-si, KR;
Bo-yeon Kim, Suwon-si, KR;
Inventors:
Byung-Wook Park, Suwon-si, KR;
Byeong-Hwan Cho, Yongin-si, KR;
Young-Dong Nam, Seongnam-si, KR;
Bo-Yeon Kim, Suwon-si, KR;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to be defective.
Park, Byung-Wook. (2009). Apparatus for testing semiconductor test system and method thereof (U.S. Patent No. 7479793). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7479793
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile