The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
May. 24, 2006
Kang Wu, Shenzhen, CN;
Wei Zhang, Shenzhen, CN;
Jun Huang, Shenzhen, CN;
LI Ding, Shenzhen, CN;
Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Bao-an District, Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A system and method for testing a Link Control Card (LCC) of a storage device includes a host, a middle plane (MP), a switch, and a testing device array. The host is connected to the testing device array for sending out command sets and receiving results. The MP is connected between the LCC and the testing device array. The switch determines the LCC to output hard reset signals and the hard reset signals are transferred to the testing device array via the MP. The testing device array includes a plurality of testing devices, and each of the testing devices includes a micro-controller unit (MCU); a connector being connected to the MCU, and coupled to the MP; an address setting unit being connected to the MCU, for setting an unique address of each of the testing devices; and a first interface being connected to the MCU for outputting results.