The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2009
Filed:
Jun. 07, 2004
Gerd Scheying, Stuttgart, DE;
Steffen Katzenberger, Bad Liebenzell, DE;
Thomas Brinz, Bissingen, DE;
Joerg Jockel, Gerlingen, DE;
Gerd Scheying, Stuttgart, DE;
Steffen Katzenberger, Bad Liebenzell, DE;
Thomas Brinz, Bissingen, DE;
Joerg Jockel, Gerlingen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
A device for analyzing a materials library includes at least one radiation source for electromagnetic radiation, which is positioned in front of the materials library, and at least two flat detectors operating in parallel, which are operable using high-sensitivity resolution and of which one is sensitive to electromagnetic radiation of a first wavelength range and the other is sensitive to electromagnetic radiation of a second wavelength range. Moreover, a method for analyzing a materials library in which the materials library is simultaneously tested using at least two methods in which electromagnetic radiation of different wavelength ranges is used. The beam is split behind the materials library as a function of wavelength and is deflected in the direction of at least two flat sensors operating using high-sensitivity resolution.