The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2009

Filed:

Apr. 25, 2003
Applicants:

Koji Mishima, Chuo-ku, JP;

Masaki Aoshima, Chuo-ku, JP;

Hiroyasu Inoue, Chuo-ku, JP;

Hideki Hirata, Chuo-ku, JP;

Hajime Utsunomiya, Chuo-ku, JP;

Inventors:

Koji Mishima, Chuo-ku, JP;

Masaki Aoshima, Chuo-ku, JP;

Hiroyasu Inoue, Chuo-ku, JP;

Hideki Hirata, Chuo-ku, JP;

Hajime Utsunomiya, Chuo-ku, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical recording medium includes a substrate, a first recording layer formed on the substrate and containing an element selected from the group consisting of Si, Ge, C, Sn, Zn and Cu as a primary component, and a second recording layer located in the vicinity of the first recording layer and containing Al as a primary component, the optical recording medium being constituted to be irradiated by a laser beam projected onto the side opposite from the substrate and the total thickness of the first recording layer and the second recording layer being equal to or thinner than 40 nm. According to the thus constituted optical recording medium, it is possible to decrease a noise level and improve a C/N ratio in a reproduced signal.


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