The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Jan. 13, 2004
John Randall West, Sunnyvale, CA (US);
Satheesh Kumar Madathiparambil Gopinathan Nair, Santa Clara, CA (US);
Andrew Hyun-chul Kim, Redwood City, CA (US);
John Randall West, Sunnyvale, CA (US);
Satheesh Kumar Madathiparambil Gopinathan Nair, Santa Clara, CA (US);
Andrew Hyun-Chul Kim, Redwood City, CA (US);
Symphony Services Corp., Palo Alto, CA (US);
Abstract
A general rule-based technique is provided for generating a test case from an abstract internal test case representation. The abstract internal test case representation is based on a test case representation model that includes application states (state information), external interaction sequences (control flow information) and input data. The abstract representation in essence provides a platform independent representation of test cases. An application object model provides the representational capabilities required for capturing structural and behavioral properties of the application under test. Rules can be specified to define which application states (state information), external interaction sequences (control information) and input data sets should be used in the generation of the test case. A technique based on platform mapping is provided to convert a test case into an automation test script for any specific test script execution environment for any specific application platform.