The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Oct. 10, 2007
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Pradmanabhan Santhanam, Yorktown Heights, NY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Pradmanabhan Santhanam, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method to create an instance of a defect-based production and testing process analysis machine (DPTPAM) provides continual process improvement based on foundational questions and classified defect data. The method includes the following steps: obtaining domain specific questions; developing a domain specific classification scheme that supports the answering of the foundational and domain specific questions; determining a method of using the domain specific classification scheme to answer both the foundational and domain specific questions; and creating a domain specific DPTPAM instance embodying the domain specific classification scheme and the method of answering the foundational and domain specific questions. The method can be implemented with a machine and a computer readable medium comprising logic for performing the method.