The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Feb. 03, 2005
Gregory Hovis, Martinez, GA (US);
Reginald I. Vachon, Atlanta, GA (US);
Gregory Hovis, Martinez, GA (US);
Reginald I. Vachon, Atlanta, GA (US);
Direct Measurements Inc., Atlanta, GA (US);
Abstract
An optical linear strain gage includes a target, a sensor, and a computer, wherein the target contains a gage length defined by end points. The target can be a one-dimensional barcode, the gage length defined between, and perpendicular to, two chosen parallel lines of the barcode. The target, including a gage length, is associated with an object such that deformation of the gage length and deformation of the object are the same; target can emit or reflect a detectable physical quantity. The sensor is compatible with and pre-processes the physical quantity from the target and provides data to the computer. The computer analyzes the data output and calculates the strain directly on the body based on the pre-processed and analyzed data. Measuring strain on an object using the strain gage includes identifying the changes in the gage length as a function of time and load applied and calculating strain.