The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Dec. 20, 2004
Applicants:

Thomas Bork Hardahl, Aalborg, DK;

Claus Graff, Klarup, DK;

Mads Peter Andersen, Aalborg Ø, DK;

Egon Toft, Aalborg Ø, DK;

Johannes Jan Struijk, Aalborg Ø, DK;

Jørgen Kim Kanters, Ålsgårde, DK;

Inventors:

Thomas Bork Hardahl, Aalborg, DK;

Claus Graff, Klarup, DK;

Mads Peter Andersen, Aalborg Ø, DK;

Egon Toft, Aalborg Ø, DK;

Johannes Jan Struijk, Aalborg Ø, DK;

Jørgen Kim Kanters, Ålsgårde, DK;

Assignee:

Aalborg Universitet, Aalborg Ø, DK;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0452 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system or a method for analysing ECG curvature wherein at least one among a number of different parameters is isolated, for indicating symptoms of diseases having influence on the ECG curvature. The system and method provides for objective, fast and effective indication of a number of symptoms derivable from an ECG curve which may be indicative of one or more diseases. This can be achieved when a first number of selected parameters are combined in at least a first mathematical analysis, where the result of the analysis can be represented as a point in a coordinate system comprising at least two axes where the system can compare the actual placement in the coordinate system with a number of reference parameters stored in the system for indicating diseases having influence on the ECG curvature.


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