The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Nov. 19, 2004
Applicants:

Pierre-jean Reissman, Villefranche sur Mer, FR;

Marc Cauchy, Issaquah, WA (US);

Inventors:

Pierre-Jean Reissman, Villefranche sur Mer, FR;

Marc Cauchy, Issaquah, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for improved image comparison is provided. An adjustable tolerance level may be set for comparing the images, and filtering may be applied to the images, for example, to suppress high frequencies in the images or to enhance low frequencies in the images. Furthermore, a geometrical transform, such as a 2D affine transform, may be applied to one of the images. The pixels of one of the images may be compared with corresponding pixels of another image to detect differences between the pixels compared. Then the outcome of comparing the pixels of the images may be determined by comparing the differences detected with the tolerance level set. The tolerance may be set by selecting one of a set of predefined tolerance levels, each of which may represent a different degree of tolerance to be used in comparison of the images.


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