The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Nov. 12, 2003
Applicant:
Michael Haisch, Aalen, DE;
Inventor:
Michael Haisch, Aalen, DE;
Assignee:
Carl Zeiss Surgical GmbH, Oberkochen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01C 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An examination system and a corresponding examination method, comprise: Arranging a tissue region in a vicinity of an object plane of a microscope and generating an optical image of the tissue region, receiving tissue data from a measuring head separate from the microscope, discriminating the tissue data into at least two data categories and displaying markings in the optical image of the tissue region in dependence of the discriminated data category and a relative position between a component of the microscope and the measuring head.