The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Jul. 07, 2007
Applicants:

Alain Blanc, Tourrettes sur Loop, FR;

Patrick Jeanniot, La Gaude, FR;

Inventors:

Alain Blanc, Tourrettes sur Loop, FR;

Patrick Jeanniot, La Gaude, FR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for analyzing the quality of high-speed signals are provided, wherein a high speed signal is sampled simultaneously a plurality of times during a sampling clock period at each of a plurality of phase rotator positions to generate a plurality of partial values, wherein subset pluralities of the partial values are associated to phase rotator positions. The partial values are combined into a global value which is analyzed to determine a quality of the high speed signal. Phase rotator behavior may also be analyzed to determine signal quality. A best position to lock a phase rotator when determining signal quality may be determined from a graphic characterization of a phase rotator position distribution.


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