The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Nov. 14, 2003
Applicants:
Werner Knebel, Kronau, DE;
Rafael Storz, Heidelberg, DE;
Inventors:
Werner Knebel, Kronau, DE;
Rafael Storz, Heidelberg, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A scanning microscope, having a detector, arranged in a detection beam path, for receiving detection light proceeding from a sample, has between the sample and the detector an optical shutter means with which the detection beam path can be blocked. A control means for controlling the shutter means is provided. The detection light beam path can be blocked automatically outside the scanning operation and in the event of an excessive detection light power level.