The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Nov. 10, 2004
Applicant:
Reiner Rygiel, Altrip, DE;
Inventor:
Reiner Rygiel, Altrip, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for adjusting two objective lenses in a 4Pi system of a scanning microscope includes imaging a reference object in respective pupils of the objective lenses so as to form a respective Fourier image for each of the objective lenses from a respective image of the reference object. The respective Fourier images are brought into coincidence by moving at least one of the objective lenses relative to the other.