The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Jan. 11, 2007
Noam Babayoff, Rishon le Zion, IL;
Isaia Glaser-inbari, Givataim, IL;
Noam Babayoff, Rishon le Zion, IL;
Isaia Glaser-Inbari, Givataim, IL;
Cadent Ltd., Or Yehuda, IL;
Abstract
Determining surface topology of a portion () of a three-dimensional structure is provided. An array of incident light beams () passing through a focusing optics () and a probing face is shone on said portion. The focusing optics defines one or more focal planes forward the probing face in a position which can be changed () by the focusing optics. The beams generate illuminated spots (t) on the structure and the intensity of returning light rays propagating in an optical path opposite to that of the incident light rays is measured () at various positions of the focal plane(s). By determining spot-specific positions yielding a maximum intensity of the returned light beams, data is generated which is representative of said topology.