The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Sep. 23, 2003
Werner Knebel, Kronau, DE;
Holger Birk, Meckesheim, DE;
Rafael Storz, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.