The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Apr. 12, 2004
Applicants:

John Erik Lindholm, Saratoga, CA (US);

Harold Robert Feldman Zatz, Palo Alto, CA (US);

Christian Rouet, San Rafael, CA (US);

Rui M. Bastos, Santa Clara, CA (US);

Inventors:

John Erik Lindholm, Saratoga, CA (US);

Harold Robert Feldman Zatz, Palo Alto, CA (US);

Christian Rouet, San Rafael, CA (US);

Rui M. Bastos, Santa Clara, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06F 7/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for synchronizing divergent samples in a programmable graphics processing unit is described. In one embodiment, the method includes the steps of determining that a divergence has occurred and detecting that a first sample of a group of samples has encountered a first synch token. The method also includes the steps of determining whether each of the other samples of the group has encountered a synch token and determining whether the synch token encountered by each of the other samples of the group is the first synch token.


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