The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Jan. 27, 2005
Applicants:

Jose DE Jesus Pineda DE Gyvez, Eindhoven, NL;

Alexander Guido Gronthoud, Eindhoven, NL;

Cristiano Cenci, Castel de Piano, IT;

Inventors:

Jose De Jesus Pineda De Gyvez, Eindhoven, NL;

Alexander Guido Gronthoud, Eindhoven, NL;

Cristiano Cenci, Castel de Piano, IT;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to an example embodiment, there is a testing device for testing a phase locked loop having a power supply input. The testing device comprises a power supply unit for providing a power supply signal Vhaving a variation profile to the power supply input of the phase locked loop, wherein a width and height of said variation profile are formed in such a way, that the voltage controlled oscillator is prevented from outputting an oscillating output signal. There is a means for disabling a feedback signal to a phase comparator of the phase locked loop such that said phase locked loop is operated in an open loop mode, and a meter for measuring a measurement signal of the phase locked loop, while said power supply signal is provided to the power supply input.


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