The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Jun. 14, 2006
Applicants:

Chih-yu Chao, Taipei, TW;

Wen-jiunn Hsieh, Taipei County, TW;

Inventors:

Chih-Yu Chao, Taipei, TW;

Wen-Jiunn Hsieh, Taipei County, TW;

Assignee:

Contrel Technology Co., Ltd., Tainan County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/10 (2006.01); G21K 5/08 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A specimen box for an electron microscope capable of observing a general specimen or a live cell is formed of a housing. The housing includes a receiving chamber formed therein and at least one view hole formed on each of a top side thereof and a bottom side thereof and communicating with the receiving chamber and coaxially aligned with the other. The distance between a bottom end of the view hole located on the top side of the housing and a top end of the view hole located on the bottom side of the housing is smaller than 50 μm. The housing is ultra-thin to enable penetration of the electron beam therethrough even though a liquid specimen is injected into the housing. A general specimen or a live cell can be put into the housing for the microscopic observation under the electron microscope.


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