The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Feb. 23, 2006
Applicants:
James L. Thomas, Cedar Crest, NM (US);
Wolfgang G. Rudolph, Albuquerque, NM (US);
Inventors:
James L. Thomas, Cedar Crest, NM (US);
Wolfgang G. Rudolph, Albuquerque, NM (US);
Assignee:
STC.UNM, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for addressable field enhancement microscopy are provided. In an embodiment, a nanoscale array of islands may be illuminated with an electromagnetic signal and addressed to differentiate signals from different islands of the nanoscale array. The differentiated signals originating from illuminating the nanoscale array may be applied to microscopy of a specimen.