The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2009

Filed:

Jul. 26, 2006
Applicants:

Soushi Rinoie, Wako, JP;

Daisuke Okonogi, Wako, JP;

Masao Utsunomiya, Wako, JP;

Inventors:

Soushi Rinoie, Wako, JP;

Daisuke Okonogi, Wako, JP;

Masao Utsunomiya, Wako, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A quality evaluating apparatus has an inspection table for placing a first or second metal separator, and a light-permeable plate for applying a predetermined pressure to a ridge of the first or second metal separator to deform the ridge and allowing a deformed state of the ridge to be inspected through the light-permeable plate while the predetermined pressure is being applied to the ridge. The quality evaluating apparatus also has an image capturing mechanism for capturing an image of the deformed state of the elastic member through the light-permeable plate, and a comparing mechanism for comparing the captured image with a preset image to evaluate the quality of the ridge.


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