The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Aug. 30, 2005
Applicant:
Naoki Kiryu, Tokyo, JP;
Inventor:
Naoki Kiryu, Tokyo, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for performing logic built-in self-tests (LBISTs) to detect 'at-speed' errors in a digital circuit. In one embodiment, an input bit pattern is propagated through target logic of the digital circuit and captured in scan chains at a normal operating speed to produce a first output bit pattern. This is repeated with the first input bit pattern at a lower test speed to produce a second output bit pattern. Differences between the first and second output bit patterns are then detected to determine whether operation of the digital circuit at the normal operating speed causes errors that are not generated at the lower test speed.