The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Nov. 15, 2006
Applicants:

Ovidiu Gheorghioiu, Mountain View, CA (US);

Christian Lita, Austin, TX (US);

Ernest R. Plassmann, Pflugerville, TX (US);

Karthikeyan Ramamoorthy, Austin, TX (US);

Jayashree Ramanathan, Round Rock, TX (US);

Inventors:

Ovidiu Gheorghioiu, Mountain View, CA (US);

Christian Lita, Austin, TX (US);

Ernest R. Plassmann, Pflugerville, TX (US);

Karthikeyan Ramamoorthy, Austin, TX (US);

Jayashree Ramanathan, Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer implemented method, apparatus, and computer usable program code for creating normalized data from markup language data. User defined parameters are received for retrieving event data, wherein the parameters define a type of event and a subset of attributes for the type of event. In response to receiving the parameters, a process is configured using the type of event and the subset of attributes for the type of event to form a configured process. A set of records is processed using the configured process, wherein the configured process places data corresponding to each attribute in the subset of attributes for the type of event from the set of records into a table to form the normalized data.


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