The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Jan. 31, 2007
Gordon W. Roberts, Montreal-West, CA;
Mouna Safi-harab, Ville Saint Laurent, CA;
Mourad Oulmane, Montreal, CA;
Gordon W. Roberts, Montreal-West, CA;
Mouna Safi-Harab, Ville Saint Laurent, CA;
Mourad Oulmane, Montreal, CA;
McGill University, Montreal, Quebec, CA;
Abstract
A method of providing an on-chip high-speed time domain digital analyzer for the characterization and analysis of signals within an integrated circuit is provided. The method involves processing the signal being characterized/analyzed in the digital domain irrespective of it's starting format. The approach performs a voltage-to-time conversion using predetermined voltage thresholds, applying a time amplification to the digital time information, measuring the amplified time difference between events and converting the amplified time difference as required by the characterization/analysis. The method allows the capture of very high-speed signals with high resolution without the requirements of complex and high-speed electronics. As such the on-chip high-speed time domain digital analyzer can function as an oscilloscope, pulse width analyzer, rise time analyzer and even logic analyzer. Further the method allows the capture and analysis of single and non-repetitive signal events unlike prior art approaches to time domain oscilloscopes.