The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Apr. 26, 2002
Applicants:
Achim Kirsch, Hamburg, DE;
Roland Stange, Hamburg, DE;
Jürgen Müller, Hamburg, DE;
Inventors:
Assignee:
Evotec Oai AG, Hamburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An optical measurement device for measurement of chemical and/or biological samples comprises an illumination means () for illuminating the sample () to be measured. Further, an optics means () is provided for imaging a sample area in an image field (). A first partial area () of the image field is covered by a first detector (), and a second partial area () of the image field () is covered by a second detector (). Thus, it is possible to change between two measurement methods without switching or to perform two measurements on a sample at the same time.