The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Dec. 15, 2003
Yi He, Santa Rosa, CA (US);
Xiangzhou Joe Zhang, Fremont, CA (US);
John E. Neeley, Larkspur, CA (US);
Yi He, Santa Rosa, CA (US);
Xiangzhou Joe Zhang, Fremont, CA (US);
John E. Neeley, Larkspur, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A baseband measurement system includes a host and a Digital Immediate Frequency (DIF) subsystem. The DIF subsystem includes both hardware and software components, such as, for example, a microprocessor and its associated software, a FPGA, one or more ASICs, and memory. The baseband measurements are processed using the FPGA, ASICs, and the microprocessor and its software. The microprocessor controls the flow of the data in and out of the memory and distributes the processing tasks to both the hardware and software components in a cooperative manner. The microprocessor orchestrates the measurements and processing by operating as a measurement state machine. Selection of the proper component is based on the type of measurement and its processing requirements, as well as the current state of the hardware and software components. The host receives the processed data and performs post-processing operations if needed. The host also displays the processed data.