The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
May. 26, 2006
Damian Edward Haydon Baskeyfield, Auldeam, GB;
Thomas J. O'reilly, Invemess, GB;
John Mcinulty, Westhill, GB;
Grenville Arthur Robinson, Rosemarkie, GB;
Anthony J. Cronshaw, Cambridge, GB;
Damian Edward Haydon Baskeyfield, Auldeam, GB;
Thomas J. O'Reilly, Invemess, GB;
John McInulty, Westhill, GB;
Grenville Arthur Robinson, Rosemarkie, GB;
Anthony J. Cronshaw, Cambridge, GB;
Lifescan Scotland Limited, Inverness, Scotland, GB;
Abstract
A method for determining a test strip calibration code for use in a meter includes inserting a calibration strip into the meter, with the calibration strip having a substrate and a permutative grey scale calibration pattern disposed on the substrate. In addition, the permutative grey scale calibration pattern includes more than one grey scale region that define a grey scale permutation uniquely corresponding to a calibration code of test strips in a package associated with the calibration strip. The method also includes: (i) detecting the permutative grey scale calibration pattern with a grey scale photodetector module of the meter, and (ii) determining a calibration code that uniquely corresponds to a grey scale permutation defined by the permutative grey scale calibration pattern based on a permutation matrix stored in the meter.