The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Aug. 12, 2002
Qiang Luo, Gainesville, FL (US);
Zhiliang Julian Chen, Plano, TX (US);
John G. Harris, Gainesville, FL (US);
Steve Clynes, Allen, TX (US);
Michael Erwin, Marlborough, MA (US);
Qiang Luo, Gainesville, FL (US);
Zhiliang Julian Chen, Plano, TX (US);
John G. Harris, Gainesville, FL (US);
Steve Clynes, Allen, TX (US);
Michael Erwin, Marlborough, MA (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A time domain sampling technique for a CMOS imager enables a wide dynamic range and flexibility by employing up to two-degrees of freedom during such sampling. Two degrees of freedom can be achieved by making one or both of an integration time and a reference (e.g., voltage or current) variable during sampling. The sampling (or image capture) is implemented by associating a time with when a pixel has a desired value relative to the reference in response to the pixel receiving incident light. The reference can be fixed or variable during different portions of the sampling, and further can be programmable to implement a desired sampling pattern for a given application.