The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Sep. 08, 2004
Applicants:

Mark Bydder, San Diego, CA (US);

Graeme M. Bydder, San Diego, CA (US);

Matthew Robson, Oxford, GB;

Peter Gatehouse, London, GB;

Inventors:

Mark Bydder, San Diego, CA (US);

Graeme M. Bydder, San Diego, CA (US);

Matthew Robson, Oxford, GB;

Peter Gatehouse, London, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and techniques for imagining samples including components with small values of T. Optionally, the systems and techniques may provide (for example) suppression of unwanted signals, enhanced contrast, and artifact control in imaging samples with small values of T.


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