The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2009
Filed:
Sep. 25, 2006
Applicants:
Chuen-der Lien, Los Altos Hills, CA (US);
Ta-ke Tien, Cupertino, CA (US);
Pao-lu Louis Huang, San Jose, CA (US);
Inventors:
Chuen-Der Lien, Los Altos Hills, CA (US);
Ta-Ke Tien, Cupertino, CA (US);
Pao-Lu Louis Huang, San Jose, CA (US);
Assignee:
Integrated Device Technologies, inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A process and system for estimating the occurrence of single event latch-up in an integrated circuit. The process involves determining the resistance between each junction and the closest appropriate tap in a regular shaped well. Each junction occurring in an irregular-shaped well is also identified. Finally, the method may make suggestions for lowering the probability that single event latch-up may occur in the integrated circuit.