The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2009

Filed:

Nov. 22, 2005
Applicant:

Kwang Ho Kim, Seoul, KR;

Inventor:

Kwang Ho Kim, Seoul, KR;

Assignees:

Frontics, Inc., , KR;

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method of measuring residual stress and, more particularly, to a residual stress measuring method using a continuous indentation tester. Due to pile-up and sink-in of a material or a blunted tip, a conventional residual stress measuring method cannot compensate for error of a real contact (indentation) depth or directly remove stress through a thermal or mechanical technique in the conventional method of measuring residual stress of a weldment, so that it is very difficult to estimate a stress-free reference curve or to quantitatively measure residual stress. However, the present invention can precisely estimate a stress-free curve of a weldment using an indentation strength ratio (OIT ratio) of a stress-free base metal to the weldment, and compensates for error, occurring in the measurement of a material having a weldment or an anisotropic stress structure, based on the indentation strength ratio, thereby more precisely measuring residual stress. Thus, unlike the conventional method, the present method can minimize error occurring in the residual stress measuring process, and agrees with actual models.


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