The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7472318 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 30, 2008

Filed:

Jun. 28, 2006
Applicants:

Nong Fan, Irvine, CA (US);

Tuan Hoang, Westminster, CA (US);

Hongtao Jiang, Anaheim, CA (US);

Inventors:

Nong Fan, Irvine, CA (US);

Tuan Hoang, Westminster, CA (US);

Hongtao Jiang, Anaheim, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for evaluating performance of a device by on-chip determination of BER may include establishing and generating PRBS test packets in a closed communication path internally within a physical layer device (PLD) and a remote PLD. A BER for the PLD may be determined from within the PLD based on a comparison of at least a portion of the generated test packets with at least a portion of the generated test packets transmitted over the closed communication path received by the PLD via the closed communication path from the remote PLD. A transmit path of the PLD may be internally coupled to a receive path of the PLD, and a receive path of the PLD may be internally coupled to a transmit path of the PLD. The PLD may be internally configured to operate in an internal optical loopback mode or an internal electrical loopback mode.


Find Patent Forward Citations

Loading…