The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2008

Filed:

Jun. 30, 2006
Applicants:

Edmond H. Yip, San Francisco, CA (US);

Paul Caprioli, Mountain View, CA (US);

Shailender Chaudhry, San Francisco, CA (US);

Jiejun LU, Sunnyvale, CA (US);

Inventors:

Edmond H. Yip, San Francisco, CA (US);

Paul Caprioli, Mountain View, CA (US);

Shailender Chaudhry, San Francisco, CA (US);

Jiejun Lu, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment of the present invention provides a system that predicts a jump target for a jump instruction. During operation, the system starts fetching the jump instruction while executing a process. Next, the system uses a program counter for the process and uses state information that is specific to the process to look up the jump target for the jump instruction. Finally, the system uses the jump target returned by the lookup as a predicted jump target for the jump instruction.


Find Patent Forward Citations

Yip, Edmond. (2008). Predicting a jump target based on a program counter and state information for a process (U.S. Patent No. 7472264). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7472264

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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