The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Jun. 05, 2007
Sanjay Gupta, Austin, TX (US);
Steven L. Roberts, Cedar Park, TX (US);
Christopher J. Spandikow, Austin, TX (US);
Sanjay Gupta, Austin, TX (US);
Steven L. Roberts, Cedar Park, TX (US);
Christopher J. Spandikow, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for test generation for system level verification using parallel algorithms are provided. The present invention generates test patterns for system level tests by exploiting the scalability of parallel algorithms while allowing for data set coloring and expected result checking. Based on the characteristics of the system being tested an iterative parallel algorithm is selected from a plurality of possible parallel algorithms. The selected parallel algorithm is then separated into separate program statements for execution by a plurality of processors. A serial version of the selected algorithm is executed to generate a set of expected results. The devised parallel version of the selected algorithm is then run to generate a set of test result data which is compared to the set of expected results. If the two sets of data match, it is determined that the system is operating correctly.