The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Jan. 07, 2005
Jonathan A. Nagel, Brooklyn, NY (US);
Jonathan A. Nagel, Brooklyn, NY (US);
Red Sky Subsea, Ltd., Chelmsford, GB;
Abstract
A method is provided for locating a fault in one or more optical amplifiers operating in saturation and located along an optical transmission path. The method begins by generating a coherent optical time domain reflectometry (COTDR) trace representing a backscattered and/or reflected optical power level along the transmission path and comparing the trace to a reference trace to generate a difference trace that represents a change in gain. The change in gain is assigned to at least one of the optical amplifiers based on the difference trace. The method comprises assigning the difference trace to faults in the optical amplifiers, equating the difference trace with a linear combination of difference trace vectors each arising from a fault in a different one of the optical amplifiers, and iterating to determine a coefficient value associated with each difference trace vector. Each nonzero coefficient value denotes a fault in an optical amplifier.