The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2008

Filed:

Jun. 20, 2002
Applicants:

Geoffrey Harding, Hamburg, DE;

Bernd David, Huettblek, DE;

Rainer Willi Eckart, Hamburg, DE;

Jens Peter Schlomka, Hamburg, DE;

Inventors:

Geoffrey Harding, Hamburg, DE;

Bernd David, Huettblek, DE;

Rainer Willi Eckart, Hamburg, DE;

Jens Peter Schlomka, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01); H01J 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray source and an X-ray apparatus with an X-ray source are provided, the X-ray source includes a liquid metal target which flows through a system of ducts and is conducted through a duct section which has a flow cross-section that is reduced relative to that of the system of ducts. The X-ray source provides a pressure source for acting on the liquid metal target such that the pressure in the liquid metal target at the area of the reduced flow cross-section equals essentially a selectable reference value or remains essentially in a pressure range between selectable limit values of the pressure. A comparatively small thickness of a window can thus be realized in conjunction with a comparatively high flow speed.


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