The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Feb. 08, 2007
Jean Rinkel, San Francisco, CA (US);
Jean-marc Dinten, Lyons, FR;
Jean Rinkel, San Francisco, CA (US);
Jean-Marc Dinten, Lyons, FR;
Commissariat A l'Energie Atomique, Paris, FR;
Abstract
The method is analytical, involves a single irradiation of the object at a plurality of incidences in order to obtain a first three-dimensional image of the total radiation received by the detector, but a double irradiation of a set of calibration phantoms, such as planar plates, in order to obtain their images of the total radiation and the scattered radiation. The three-dimensional image serves only to precisely evaluate, for each projection of the radiation through the object, the equivalent length of the material of the phantoms in order to obtain a similar scattered radiation. In a known manner, a ratio of scattered radiation layers is then calculated for the object and the phantoms according to the total radiation that they have received, and the scattered radiation of the object is obtained by the radiation scattered by the phantoms, which have been measured, and the ratio.