The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Jun. 03, 2005
Yutaka Kashihara, Chigasaki, JP;
Akihito Ogawa, Kawasaki, JP;
Naoki Morishita, Yokohama, JP;
Masaki Nakano, Tokyo, JP;
Masatsugu Ogawa, Tokyo, JP;
Shuichi Ookubo, Tokyo, JP;
Toshiaki Iwanaga, Tokyo, JP;
Yutaka Kashihara, Chigasaki, JP;
Akihito Ogawa, Kawasaki, JP;
Naoki Morishita, Yokohama, JP;
Masaki Nakano, Tokyo, JP;
Masatsugu Ogawa, Tokyo, JP;
Shuichi Ookubo, Tokyo, JP;
Toshiaki Iwanaga, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In an optical disk system using a PRML identification system, a method for deriving an optimum recording wave in a short period of time is provided. Parameters of the recording wave are adjusted by using an evaluation value obtained by a signal evaluation method which is suitable for the PRML identification system as an index. In this case, as a parameter adjusting method, a plurality of adjusting methods are utilized.