The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2008
Filed:
Mar. 30, 2007
Atsushi Kishioka, Fujisawa, JP;
Atsushi Kishioka, Fujisawa, JP;
Hitachi Displays, Ltd., Mobara-shi, JP;
Abstract
A rubbing angle measuring equipment of the invention includes an light source unit, a measuring optical system, an imaging means, and an image evaluation means in which the measuring optical system is adapted such that a light from the light source unit passes by way of an illumination optical system and a polarizer to a rubbed measuring object and further passes by way of an analyzer and a focusing optical system to the imaging means, and the surface of the measuring object is focused to the imaging means, and in which image signals obtained by the imaging means are transmitted to the image evaluation means where signals having an intense periodicity in the image are detected, to measure the rubbing angle of the measuring object in a nondestructive manner, within a short period and at a high accuracy of 0.1° or more.